Test Integrations
We provide seamless test integrations by leveraging our extensive expertise in microcontact technology, advanced test boards and state-of-the-art electro-mechanical interface components.
Our integrated approach enables us to optimize the interaction between probe cards, test hardware, and semiconductor devices, delivering superior testing capabilities for even the most complex applications – ensuring accuracy, reliability and efficiency.
TIPS Power KGD
(Known Good Power Die)
Contact units (Probe Cards/ Micro Chucks) for singulated die testing of power devices. Very low parasitic inductance combined with patented HV flashover suppression allows for both static DC and ultra-fast dynamic AC test – ranging up to 10 kV and 3000+ A.
MeasureOne – Your Integration Connection
MeasureOne™ is a unique commitment between T.I.P.S. and FormFactor to deliver optimized solutions to address customers’ applications. T.I.P.S. and FormFactor work together to configure and install solutions with validated performance and post-installation service and support.
The complete test cell solution is optimized to provide safe, accurate, and automated on-wafer testing of power devices.
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Made in Austria.
We are your partner you can rely on. With a deep understanding of our customers’ needs for highest quality, reliability and on-time availability of test hardware.